Literature DB >> 20972309

Calibration of higher eigenmode spring constants of atomic force microscope cantilevers.

Jose R Lozano1, Daniel Kiracofe, John Melcher, Ricardo Garcia, Arvind Raman.   

Abstract

Standard spring constant calibration methods are compared when applied to higher eigenmodes of cantilevers used in dynamic atomic force microscopy (dAFM). Analysis shows that Sader's original method (Sader et al 1999 Rev. Sci. Instrum. 70 3967-9), which relies on a priori knowledge of the eigenmode shape, is poorly suited for the calibration of higher eigenmodes. On the other hand, the thermal noise method (Hutter and Bechhoefer 1993 Rev. Sci. Instrum. 64 1868-73) does not require knowledge of the eigenmode and remains valid for higher eigenmodes of the dAFM probe. Experimental measurements of thermal vibrations in air for three representative cantilevers are provided to support the theoretical results.

Entities:  

Year:  2010        PMID: 20972309     DOI: 10.1088/0957-4484/21/46/465502

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  13 in total

1.  Substrate Deformation Predicts Neuronal Growth Cone Advance.

Authors:  Ahmad I M Athamneh; Alexander X Cartagena-Rivera; Arvind Raman; Daniel M Suter
Journal:  Biophys J       Date:  2015-10-06       Impact factor: 4.033

2.  Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip-surface interactions.

Authors:  Stanislav S Borysov; Daniel Forchheimer; David B Haviland
Journal:  Beilstein J Nanotechnol       Date:  2014-10-29       Impact factor: 3.649

3.  Improving image contrast and material discrimination with nonlinear response in bimodal atomic force microscopy.

Authors:  Daniel Forchheimer; Robert Forchheimer; David B Haviland
Journal:  Nat Commun       Date:  2015-02-10       Impact factor: 14.919

4.  Magnetic properties of individual Co2FeGa Heusler nanoparticles studied at room temperature by a highly sensitive co-resonant cantilever sensor.

Authors:  Julia Körner; Christopher F Reiche; Rasha Ghunaim; Robert Fuge; Silke Hampel; Bernd Büchner; Thomas Mühl
Journal:  Sci Rep       Date:  2017-08-21       Impact factor: 4.379

5.  Measuring nanoscale viscoelastic parameters of cells directly from AFM force-displacement curves.

Authors:  Yuri M Efremov; Wen-Horng Wang; Shana D Hardy; Robert L Geahlen; Arvind Raman
Journal:  Sci Rep       Date:  2017-05-08       Impact factor: 4.379

6.  Determining cantilever stiffness from thermal noise.

Authors:  Jannis Lübbe; Matthias Temmen; Philipp Rahe; Angelika Kühnle; Michael Reichling
Journal:  Beilstein J Nanotechnol       Date:  2013-03-28       Impact factor: 3.649

7.  Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor.

Authors:  Julian Stirling; Gordon A Shaw
Journal:  Beilstein J Nanotechnol       Date:  2013-01-08       Impact factor: 3.649

8.  Optimal geometry for a quartz multipurpose SPM sensor.

Authors:  Julian Stirling
Journal:  Beilstein J Nanotechnol       Date:  2013-06-17       Impact factor: 3.649

9.  A Unique Self-Sensing, Self-Actuating AFM Probe at Higher Eigenmodes.

Authors:  Zhichao Wu; Tong Guo; Ran Tao; Leihua Liu; Jinping Chen; Xing Fu; Xiaotang Hu
Journal:  Sensors (Basel)       Date:  2015-11-13       Impact factor: 3.576

10.  Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach.

Authors:  Edgar Cruz Valeriano; José Juan Gervacio Arciniega; Christian Iván Enriquez Flores; Susana Meraz Dávila; Joel Moreno Palmerin; Martín Adelaido Hernández Landaverde; Yuri Lizbeth Chipatecua Godoy; Aime Margarita Gutiérrez Peralta; Rafael Ramírez Bon; José Martín Yañez Limón
Journal:  Beilstein J Nanotechnol       Date:  2020-05-04       Impact factor: 3.649

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