| Literature DB >> 20717231 |
E Ikonen, J Kauppinen, T Korkolainen, J Luukkainen, K Riski.
Abstract
An automated interferometer for primary calibration of gauge blocks is described that requires no prior knowledge of the gauge length. For short gauge blocks, the results agree with previous calibrations to within 10 nm.Year: 1991 PMID: 20717231 DOI: 10.1364/AO.30.004477
Source DB: PubMed Journal: Appl Opt ISSN: 1559-128X Impact factor: 1.980