Literature DB >> 20616866

Genetic control and QTL analysis of cotyledon bleaching resistance in green field pea (Pisum sativum L.).

Lasantha Ubayasena1, Kirstin Bett, Bunyamin Tar'an, Perumal Vijayan, Thomas Warkentin.   

Abstract

Resistance to bleaching is an important factor for quality grading of Canadian green field pea and an important selection criterion in green pea improvement. This research was conducted to determine the genetic control of bleaching resistance in green peas using 90 recombinant inbred lines (RILs) derived from a cross between cultivars Orb and CDC Striker. These lines were evaluated under field conditions for two years in two locations in Saskatchewan, Canada. Harvested whole seeds and cotyledons were evaluated for greenness using the Hunter Lab colorimeter before and after exposure to a high light intensity accelerated bleaching treatment. The RILs were genotyped using amplified fragment length polymorphism (AFLP) and simple sequence repeat (SSR) molecular markers. Heritability estimates for whole seed and cotyledon greenness were moderate (0.72 and 0.69, respectively) and increased when assessed after exposing whole seeds and cotyledons to accelerated bleaching conditions (0.83 and 0.82, respectively). The genetic linkage map constructed based on a total of 224 AFLP and SSR markers spanned over 890 cM of the pea genome. Multiple QTL mapping detected major QTLs on LG IV and LG V as well as location- and year-specific QTLs on LG II and LG III associated with green cotyledon bleaching resistance in field pea. The results demonstrated the importance of the seed coat in protecting the cotyledons from bleaching.

Entities:  

Mesh:

Substances:

Year:  2010        PMID: 20616866     DOI: 10.1139/g10-013

Source DB:  PubMed          Journal:  Genome        ISSN: 0831-2796            Impact factor:   2.166


  7 in total

Review 1.  Omics resources and omics-enabled approaches for achieving high productivity and improved quality in pea (Pisum sativum L.).

Authors:  Arun K Pandey; Diego Rubiales; Yonggang Wang; Pingping Fang; Ting Sun; Na Liu; Pei Xu
Journal:  Theor Appl Genet       Date:  2021-01-12       Impact factor: 5.699

2.  Identification of genome regions controlling cotyledon, pod wall/seed coat and pod wall resistance to pea weevil through QTL mapping.

Authors:  N Aryamanesh; Y Zeng; O Byrne; D C Hardie; A M Al-Subhi; T Khan; K H M Siddique; G Yan
Journal:  Theor Appl Genet       Date:  2013-11-15       Impact factor: 5.699

Review 3.  Genomics-assisted breeding in four major pulse crops of developing countries: present status and prospects.

Authors:  Abhishek Bohra; Manish K Pandey; Uday C Jha; Balwant Singh; Indra P Singh; Dibendu Datta; Sushil K Chaturvedi; N Nadarajan; Rajeev K Varshney
Journal:  Theor Appl Genet       Date:  2014-04-08       Impact factor: 5.699

4.  Quantifying the colour loss of green field pea (Pisum sativum L.) due to bleaching.

Authors:  Linda S McDonald; Phillip A Salisbury; Rebecca Ford; Joseph F Panozzo
Journal:  PLoS One       Date:  2019-08-23       Impact factor: 3.240

5.  Identification of quantitative trait loci (QTL) controlling resistance to pea weevil (Bruchus pisorum) in a high-density integrated DArTseq SNP-based genetic map of pea.

Authors:  Thais Aznar-Fernández; Eleonora Barilli; María J Cobos; Andrzej Kilian; Jason Carling; Diego Rubiales
Journal:  Sci Rep       Date:  2020-01-08       Impact factor: 4.379

6.  Ancient orphan crop joins modern era: gene-based SNP discovery and mapping in lentil.

Authors:  Andrew G Sharpe; Larissa Ramsay; Lacey-Anne Sanderson; Michael J Fedoruk; Wayne E Clarke; Rong Li; Sateesh Kagale; Perumal Vijayan; Albert Vandenberg; Kirstin E Bett
Journal:  BMC Genomics       Date:  2013-03-18       Impact factor: 3.969

Review 7.  Genomic Tools in Pea Breeding Programs: Status and Perspectives.

Authors:  Nadim Tayeh; Grégoire Aubert; Marie-Laure Pilet-Nayel; Isabelle Lejeune-Hénaut; Thomas D Warkentin; Judith Burstin
Journal:  Front Plant Sci       Date:  2015-11-27       Impact factor: 5.753

  7 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.