| Literature DB >> 19756269 |
William C Chueh1, Sossina M Haile.
Abstract
Small polaron carrier density in epitaxial, doped CeO(2) thin films under low oxygen partial pressure was determined from electrochemically-measured capacitance after accounting for interfacial effects and shown to agree well with bulk values.Entities:
Year: 2009 PMID: 19756269 DOI: 10.1039/b910903j
Source DB: PubMed Journal: Phys Chem Chem Phys ISSN: 1463-9076 Impact factor: 3.676