| Literature DB >> 19710869 |
Abstract
A simple technique for in situ measurements of pulsed Gaussian-beam spot sizes is reported. This technique is particularly useful for measurements on highly focused beam spots. It can also be used for absolute calibration of the threshold-energy fluences for pulsed-laser-induced effects. The thresholds for several effects in picosecondlaser-induced phase transformation on silicon-crystal surfaces are calibrated with this technique.Entities:
Year: 1982 PMID: 19710869 DOI: 10.1364/ol.7.000196
Source DB: PubMed Journal: Opt Lett ISSN: 0146-9592 Impact factor: 3.776