| Literature DB >> 19529789 |
Brian M Taff, Salil P Desai, Joel Voldman.
Abstract
We present a platform for parallelized manipulations of individual polarizable micron-scale particles (i.e., microparticles) that combines negative dielectrophoretic forcing with the passive capture of hydrodynamic weir-based trapping. Our work enables manipulations using ejection- andor exclusion-based methods. In ejection operations, we unload targeted weirs by displacing microparticles from their capture faces via electrode activation. In exclusion-based operations, we prevent weir loading by activating selected on-chip electrodes before introducing microparticles into the system. Our work describes the device's passive loading dynamics and demonstrates enhanced functionalities by forming a variety of particle patterns.Year: 2009 PMID: 19529789 PMCID: PMC2682758 DOI: 10.1063/1.3085955
Source DB: PubMed Journal: Appl Phys Lett ISSN: 0003-6951 Impact factor: 3.791