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Literature DB >> 19424135

Materials science: Enter the oxides.

Joerg Heber.

Abstract

Entities: Chemical

Year: 2009 PMID： 19424135 DOI： 10.1038/459028a

Source DB: PubMed Journal: Nature ISSN： 0028-0836 Impact factor: 49.962

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9 in total

1. Superconducting interfaces between insulating oxides.

Authors: N Reyren; S Thiel; A D Caviglia; L Fitting Kourkoutis; G Hammerl; C Richter; C W Schneider; T Kopp; A-S Rüetschi; D Jaccard; M Gabay; D A Muller; J-M Triscone; J Mannhart
Journal: Science Date: 2007-08-02 Impact factor: 47.728

2. Multiferroics: progress and prospects in thin films.

Authors: R Ramesh; Nicola A Spaldin
Journal: Nat Mater Date: 2007-01 Impact factor: 43.841

3. Quantum Hall effect in polar oxide heterostructures.

Authors: A Tsukazaki; A Ohtomo; T Kita; Y Ohno; H Ohno; M Kawasaki
Journal: Science Date: 2007-01-25 Impact factor: 47.728

4. Electric field control of the LaAlO3/SrTiO3 interface ground state.

Authors: A D Caviglia; S Gariglio; N Reyren; D Jaccard; T Schneider; M Gabay; S Thiel; G Hammerl; J Mannhart; J-M Triscone
Journal: Nature Date: 2008-12-04 Impact factor: 49.962

5. Thousandfold change in resistivity in magnetoresistive la-ca-mn-o films.

Authors: S Jin; T H Tiefel; M McCormack; R A Fastnacht; R Ramesh; L H Chen
Journal: Science Date: 1994-04-15 Impact factor: 47.728

6. Atomic Control of the SrTiO3 Crystal Surface.

Authors: M Kawasaki; K Takahashi; T Maeda; R Tsuchiya; M Shinohara; O Ishiyama; T Yonezawa; M Yoshimoto; H Koinuma
Journal: Science Date: 1994-12-02 Impact factor: 47.728

7. A ferroelectric oxide made directly on silicon.

Authors: Maitri P Warusawithana; Cheng Cen; Charles R Sleasman; Joseph C Woicik; Yulan Li; Lena Fitting Kourkoutis; Jeffrey A Klug; Hao Li; Philip Ryan; Li-Peng Wang; Michael Bedzyk; David A Muller; Long-Qing Chen; Jeremy Levy; Darrell G Schlom
Journal: Science Date: 2009-04-17 Impact factor: 47.728

8. Artificial charge-modulationin atomic-scale perovskite titanate superlattices.

Authors: A Ohtomo; D A Muller; J L Grazul; H Y Hwang
Journal: Nature Date: 2002-09-26 Impact factor: 49.962

9. A high-mobility electron gas at the LaAlO3/SrTiO3 heterointerface.

Authors: A Ohtomo; H Y Hwang
Journal: Nature Date: 2004-01-29 Impact factor: 49.962

9 in total

17 in total

1. Emergent phenomena at oxide interfaces.

Authors: H Y Hwang; Y Iwasa; M Kawasaki; B Keimer; N Nagaosa; Y Tokura
Journal: Nat Mater Date: 2012-01-24 Impact factor: 43.841

2. Interface control of bulk ferroelectric polarization.

Authors: P Yu; W Luo; D Yi; J X Zhang; M D Rossell; C-H Yang; L You; G Singh-Bhalla; S Y Yang; Q He; Q M Ramasse; R Erni; L W Martin; Y H Chu; S T Pantelides; S J Pennycook; R Ramesh
Journal: Proc Natl Acad Sci U S A Date: 2012-05-30 Impact factor: 11.205

Materials science: Enter the oxides.

1. Superconducting interfaces between insulating oxides.

2. Multiferroics: progress and prospects in thin films.

3. Quantum Hall effect in polar oxide heterostructures.

4. Electric field control of the LaAlO3/SrTiO3 interface ground state.

5. Thousandfold change in resistivity in magnetoresistive la-ca-mn-o films.

6. Atomic Control of the SrTiO3 Crystal Surface.

7. A ferroelectric oxide made directly on silicon.

8. Artificial charge-modulationin atomic-scale perovskite titanate superlattices.

9. A high-mobility electron gas at the LaAlO3/SrTiO3 heterointerface.

1. Emergent phenomena at oxide interfaces.

2. Interface control of bulk ferroelectric polarization.

3. Reversible electric control of exchange bias in a multiferroic field-effect device.

4. Resistance is futile.

5. Oxide materials: superconductivity on the other side.

6. Microscopic origins for stabilizing room-temperature ferromagnetism in ultrathin manganite layers.

7. Orbital reconstruction in nonpolar tetravalent transition-metal oxide layers.

8. Emergent Magnetic Phenomenon with Unconventional Structure in Epitaxial Manganate Thin Films.

9. Topological oxide insulator in cubic perovskite structure.

10. Femtosecond laser ablation-based mass spectrometry: An ideal tool for stoichiometric analysis of thin films.