| Literature DB >> 19417298 |
R W Liptak1, B Devetter, J H Thomas, U Kortshagen, S A Campbell.
Abstract
An SF(6)-based plasma has been employed to perform in-flight etching of silicon nanocrystals (Si-NCs) after they were synthesized in an SiH(4)-based plasma. The photoluminescence of the Si-NCs blue-shifts after etching, indicating an etching-induced size reduction of the Si-NCs. It is shown that both the SF(6) plasma power and the flow rate can be utilized to control the etch rate (and thus the size reduction) of the Si-NCs. The SF(6) etched Si-NCs show only low concentrations of residual impurities other than fluorine. Quantum yields as high as 50% have been observed from these SF(6) etched Si-NCs despite oxidation.Entities:
Year: 2008 PMID: 19417298 DOI: 10.1088/0957-4484/20/3/035603
Source DB: PubMed Journal: Nanotechnology ISSN: 0957-4484 Impact factor: 3.874