Literature DB >> 19030065

Distance measurements by combined method based on a femtosecond pulse laser.

Ki-Nam Joo1, Yunseok Kim, Seung-Woo Kim.   

Abstract

We describe a combined interferometric scheme that enables absolute distance measurements using a femtosecond pulse laser. This method is combined with synthetic wavelength interferometry (SWI), time of flight (TOF) and spectrally-resolved interferometry (SRI) using the optical comb of femtosecond laser. Each technique provides distinct measuring resolutions and ambiguity ranges which are complementary to each other. These separate measurement principles are incorporated and implemented simultaneously and the unified output can enhance the dynamic range of the measuring system. Our experimental results demonstrate an example of absolute distance measurement with the proposed technique and we discuss the possibility of the combined method to measure long distances and the important factors for the implementation.

Year:  2008        PMID: 19030065     DOI: 10.1364/oe.16.019799

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  4 in total

1.  Comb-referenced laser distance interferometer for industrial nanotechnology.

Authors:  Yoon-Soo Jang; Guochao Wang; Sangwon Hyun; Hyun Jay Kang; Byung Jae Chun; Young-Jin Kim; Seung-Woo Kim
Journal:  Sci Rep       Date:  2016-08-25       Impact factor: 4.379

2.  Synthetic wavelength interferometry of an optical frequency comb for absolute distance measurement.

Authors:  Guanhao Wu; Lei Liao; Shilin Xiong; Guoyuan Li; Zhijian Cai; Zebin Zhu
Journal:  Sci Rep       Date:  2018-03-12       Impact factor: 4.379

3.  Improvement of Distance Measurement Based on Dispersive Interferometry Using Femtosecond Optical Frequency Comb.

Authors:  Qiong Niu; Mingyu Song; Jihui Zheng; Linhua Jia; Junchen Liu; Lingman Ni; Ju Nian; Xingrui Cheng; Fumin Zhang; Xinghua Qu
Journal:  Sensors (Basel)       Date:  2022-07-20       Impact factor: 3.847

4.  Detecting Topological Defect Dark Matter Using Coherent Laser Ranging System.

Authors:  Wanpeng Yang; Jianxiao Leng; Shuangyou Zhang; Jianye Zhao
Journal:  Sci Rep       Date:  2016-07-08       Impact factor: 4.379

  4 in total

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