Charge-injection device detection for improved performance in atomic-emission spectroscopy.

Studies into the use of simultaneous multiwavelength detection over a broad wavelength region (220-520 nm) demonstrate the power and flexibility offered by a charge-injection device for detection in atomic-emission spectrometry. An echelle monochromator and a charge-injection device utilizing the general electric CID17B array detector are used in conjunction with a direct current plasma source to perform multi-line analysis for Mg, Sr, Fe, Dy, Ho and Yb, increasing the sensitivity and limits of detection. By monitoring the 341-nm OH band and background Ar emission lines, changes in the nebulization and excitation conditions are easily detected. The presence of an organic matrix component not present in the standards is detected by observing the C(I) emission at 247.8 nm. These diagnostic tools can be combined with the use of an internal standard to obtain a reliability not previously available in automated AES instrumentation.