Literature DB >> 18849977

Electron-trapping polycrystalline materials with negative electron affinity.

Keith P McKenna1, Alexander L Shluger.   

Abstract

The trapping of electrons by grain boundaries in semiconducting and insulating materials is important for a wide range of physical problems, for example, relating to: electroceramic materials with applications as sensors, varistors and fuel cells, reliability issues for solar cell and semiconductor technologies and electromagnetic seismic phenomena in the Earth's crust. Surprisingly, considering their relevance for applications and abundance in the environment, there have been few experimental or theoretical studies of the electron trapping properties of grain boundaries in highly ionic materials such as the alkaline earth metal oxides and alkali halides. Here we demonstrate, by first-principles calculations on MgO, LiF and NaCl, a qualitatively new type of electron trapping at grain boundaries. This trapping is associated with the negative electron affinity of these materials and is unusual as the electron is confined in the empty space inside the dislocation cores.

Entities:  

Year:  2008        PMID: 18849977     DOI: 10.1038/nmat2289

Source DB:  PubMed          Journal:  Nat Mater        ISSN: 1476-1122            Impact factor:   43.841


  3 in total

1.  Atom-resolved imaging of ordered defect superstructures at individual grain boundaries.

Authors:  Zhongchang Wang; Mitsuhiro Saito; Keith P McKenna; Lin Gu; Susumu Tsukimoto; Alexander L Shluger; Yuichi Ikuhara
Journal:  Nature       Date:  2011-11-16       Impact factor: 49.962

2.  Optical properties of nanocrystal interfaces in compressed MgO nanopowders.

Authors:  Keith P McKenna; David Koller; Andreas Sternig; Nicolas Siedl; Niranjan Govind; Peter V Sushko; Oliver Diwald
Journal:  ACS Nano       Date:  2011-04-04       Impact factor: 15.881

3.  Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices.

Authors:  Jonathan J Bean; Mitsuhiro Saito; Shunsuke Fukami; Hideo Sato; Shoji Ikeda; Hideo Ohno; Yuichi Ikuhara; Keith P McKenna
Journal:  Sci Rep       Date:  2017-04-04       Impact factor: 4.379

  3 in total

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