Literature DB >> 18352415

Indirect electric field doping of the CuO2 planes of the cuprate NdBa2Cu3O7 superconductor.

M Salluzzo1, G Ghiringhelli, J C Cezar, N B Brookes, G M De Luca, F Fracassi, R Vaglio.   

Abstract

The mechanism of field-effect doping in the 123 high critical temperature superconductors (HTS) has been investigated by x-ray absorption spectroscopy in the presence of an electric field. We demonstrate that holes are created at the CuO chains of the charge reservoir and that field-effect doping of the CuO(2) planes occurs by charge transfer, from the chains to the planes, of a fraction of the overall induced holes. The electronic properties of the charge reservoir and of the dielectric-HTS interface determine the electric field doping of the CuO(2) planes.

Entities:  

Year:  2008        PMID: 18352415     DOI: 10.1103/PhysRevLett.100.056810

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  3 in total

1.  In operando evidence of deoxygenation in ionic liquid gating of YBa2Cu3O7-X.

Authors:  Ana M Perez-Muñoz; Pedro Schio; Roberta Poloni; Alejandro Fernandez-Martinez; Alberto Rivera-Calzada; Julio C Cezar; Eduardo Salas-Colera; German R Castro; Joseph Kinney; Carlos Leon; Jacobo Santamaria; Javier Garcia-Barriocanal; Allen M Goldman
Journal:  Proc Natl Acad Sci U S A       Date:  2016-12-27       Impact factor: 11.205

2.  Self-doping processes between planes and chains in the metal-to-superconductor transition of YBa2Cu3O6.9.

Authors:  M Magnuson; T Schmitt; V N Strocov; J Schlappa; A S Kalabukhov; L-C Duda
Journal:  Sci Rep       Date:  2014-11-12       Impact factor: 4.379

3.  Superconductor to Mott insulator transition in YBa2Cu3O7/LaCaMnO3 heterostructures.

Authors:  B A Gray; S Middey; G Conti; A X Gray; C-T Kuo; A M Kaiser; S Ueda; K Kobayashi; D Meyers; M Kareev; I C Tung; Jian Liu; C S Fadley; J Chakhalian; J W Freeland
Journal:  Sci Rep       Date:  2016-09-15       Impact factor: 4.379

  3 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.