| Literature DB >> 18301711 |
Gwen A Frishkoff1, Robert M Frank, Jiawei Rong, Dejing Dou, Joseph Dien, Laura K Halderman.
Abstract
This paper describes a framework for automated classification and labeling of patterns in electroencephalographic (EEG) and magnetoencephalographic (MEG) data. We describe recent progress on four goals: 1) specification of rules and concepts that capture expert knowledge of event-related potentials (ERP) patterns in visual word recognition; 2) implementation of rules in an automated data processing and labeling stream; 3) data mining techniques that lead to refinement of rules; and 4) iterative steps towards system evaluation and optimization. This process combines top-down, or knowledge-driven, methods with bottom-up, or data-driven, methods. As illustrated here, these methods are complementary and can lead to development of tools for pattern classification and labeling that are robust and conceptually transparent to researchers. The present application focuses on patterns in averaged EEG (ERP) data. We also describe efforts to extend our methods to represent patterns in MEG data, as well as EM patterns in source (anatomical) space. The broader aim of this work is to design an ontology-based system to support cross-laboratory, cross-paradigm, and cross-modal integration of brain functional data. Tools developed for this project are implemented in MATLAB and are freely available on request.Entities:
Year: 2007 PMID: 18301711 PMCID: PMC2246027 DOI: 10.1155/2007/14567
Source DB: PubMed Journal: Comput Intell Neurosci
Figure 1(a) Time course of P100 pattern, plotted at left occipital electrode, O1. Time is plotted on the -axis (0–700 milliseconds); each vertical hash mark represents 100 milliseconds. Amplitude is plotted on the -axis (scale, V). The dark vertical line marks the time of peak amplitude (∼120 milliseconds). (b) Scalp topography of the P100 pattern, plotted at the time of peak amplitude. Red, positive. Blue, negative.
Figure 2Pattern classification and labeling scheme. Knowledge engineering (processes 1, 2) includes “top-down” specification of ERP concepts and rules, formulated by domain experts. Component analysis and measure generation (processes 3, 4) yield summary metrics that are used for pattern classification and labeling. Implementation and operationalization of pattern rules (processes 5, 6) are detailed in Section 2. Data mining (processes 7, 8) includes “bottom-up” or data-driven methods for clustering and discovery of pattern rules (Section 5). System evaluation is detailed in Section 4.
Spatial and temporal concepts used to define the eight target patterns. Regions of interest (ROIs) are defined in Appendix A.
| Pattern | Window | ROI |
|---|---|---|
| P100 | 60–150 | occipital |
| N100 | 151–230 | occipital |
| N2 | 231–300 | post-temporal |
| P1r | 250–400 | parietal |
| N3 | 250–400 | left anterior |
| MFN | 250–450 | frontal |
| N4 | 350–550 | parietal |
| P300 | 401–700 | parietal |
Figure 3Autoclassification and labeling results. (a) Percentage of observations matching rule criteria for each pattern. (b) Topogragraphy and (c) time course of pattern factors.
Percentage of ERP observations for each factor that matched expert-defined rule criteria.
| % Observations meeting pattern criteria | ||||||||
|---|---|---|---|---|---|---|---|---|
| Factor | P100 | N100 | N2 | N3 | P1r | MFN | N4 | N3 |
| Fac#01 | — | — | — | — | — | — | — | — |
| Fac#02 | — | — | — | — | — |
|
| 59.72 |
| Fac#03 | — |
| — | — | — | — | — | — |
| Fac#04 |
| — | — | — | — | — | — | — |
| Fac#05 | — | — | — | — | — | — | — | — |
| Fac#06 | — | — | — | — | — | — | — | — |
| Fac#07 | — | — | 69.44 |
|
| 22.92 | — | — |
| Fac#08 | 34.72 | — | — | — | — | — | — | — |
| Fac#09 | — | — | — | — | — | — | — |
|
| Fac#10 | — | 51.39 |
| — | — | — | — | — |
| Fac#11 | — | — | — | 47.92 | 25.69 | 34.03 | 35.42 | — |
| Fac#12 | — | — | — | — | — | — | — | — |
| Fac#13 | — | — | — | 59.03 | 62.50 | 40.97 | — | — |
| Fac#14 | — | — | — | — | — | — | — | — |
| Fac#15 | — | — | — | — | — | — | — | 9.72 |
Interrater reliability (Spearman-Brown r).
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|---|---|---|---|
| P100 | .51* | .41* | .72** |
| N100 | −.04 | .35* | .45* |
Comparison of autolabeling with expert labels.
| Pattern | Person | Spearman-Brwon | %Agr |
|---|---|---|---|
| P100 | 0.60 | 0.75 | 0.90 |
| N100 | 0.26 | 0.41 | 0.84 |
| N2 | 0.12 | 0.21 | 0.53 |
| N3 | 0.41 | 0.58 | 0.63 |
| P1r | 0.47 | 0.64 | 0.76 |
| MFN | 0.33 | 0.49 | 0.40 |
| N4 | 0.37 | 0.54 | 0.81 |
| P3 | 0.30 | 0.46 | 0.64 |
EM clustering results (NP: nonpatterns).
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|---|---|---|---|---|---|---|---|---|---|
| P100 | 0 | 0 | 0 | 0 |
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| 0 | 0 | 0 |
| N100 | 1 | 0 | 0 | 0 | 0 | 0 | 7 | 30 |
|
| N2 |
| 0 | 0 | 0 | 17 | 0 | 0 | 3 | 8 |
| N3 | 5 | 0 | 0 | 0 | 4 | 2 | 2 |
| 1 |
| P1r | 11 | 0 | 14 | 0 | 14 | 6 | 5 |
| 0 |
| MFN | 0 | 0 | 0 |
| 0 | 9 | 0 | 0 | 0 |
| N4 | 0 | 0 | 0 |
| 0 | 1 | 0 | 0 | 0 |
| P3 | 0 |
| 0 | 2 | 0 | 0 | 0 | 0 | 0 |
| NP | 26 | 28 | 22 | 197 | 39 | 16 |
| 64 | 20 |
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| Pseudo-known | Difference in mean intensity over ROI at time of peak latency (Nonwords-Words) |
| RareMisses-RareHits | Difference in mean intensity over ROI at time of peak latency (RareMisses-RareHits) | |
| RareHits-Known | Difference in mean intensity over ROI at time of peak latency (RareHits-Known) | |
| Pseudo-RareMisses | Difference in mean intensity over ROI at time of peak latency (Nonwords-RareMisses) | |
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| IN-max | Maximum intensity (in microvolts) at time of peak latency |
| IN-max to Baseline | Maximum intensity (in microvolts) at time of peak latency with respect to intensity at TI-begin | |
| IN-min | Maximum intensity (in microvolts) at time of peak latency | |
| IN-min to Baseline | Maximum intensity (in microvolts) at time of peak latency with respect to intensity at TI-begin | |
| SP-max | Channel associated with maximum intensity, IN-max | |
| SP-max ROI | Channel group (ROI) containing SP-max | |
| SP-min | Channel associated with manimum intensity, IN-min | |
| SP-min ROI | Channel group (ROI) containing SP-min | |
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| IN-mean ROI | Mean intensity (in microvolts) at time of peak latency for a specified channel group |
| IN-LOCC | Mean intensity (in microvolts) at time of peak latency for left occipital channel group | |
| IN-ROCC | Mean intensity (in microvolts) at time of peak latency for right occipital channel group | |
| IN-LPAR | Mean intensity (in microvolts) at time of peak latency for left parietal channel group | |
| IN-RPAR | Mean intensity (in microvolts) at time of peak latency for right parietal channel group | |
| IN-LPTEM | Mean intensity (in microvolts) at time of peak latency for left posterior temporal channel group | |
| IN-RPTEM | Mean intensity (in microvolts) at time of peak latency for right posterior temporal channel group | |
| IN-LATEM | Mean intensity (in microvolts) at time of peak latency for left anterior temporal channel group | |
| IN-RATEM | Mean intensity (in microvolts) at time of peak latency for right anterior temporal channel group | |
| IN-LORB | Mean intensity (in microvolts) at time of peak latency for left orbital channel group | |
| IN-RORB | Mean intensity (in microvolts) at time of peak latency for right orbital channel group | |
| IN-LFRON | Mean intensity (in microvolts) at time of peak latency for left frontal channel group | |
| IN-RFRON | Mean intensity (in microvolts) at time of peak latency for right frontal channel group | |
| SP-cor | Correlation between factor topography and topography of target pattern | |
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| TI-max | Latency (in milliseconds) of maximum or minimum amplitude |
| TI-begin | Onset (in milliseconds) of waveform excurstion containing peak intensity | |
| TI-end | Conclusion (in milliseconds) of waveform excurstion containing peak intensity | |
| TI-duration | Duration (in milliseconds) of pattern, equal to TI-begin minus TI-end | |