Literature DB >> 17614617

Direct measurement of cantilever spring constants and correction for cantilever irregularities using an instrumented indenter.

Z Charles Ying1, Mark G Reitsma, Richard S Gates.   

Abstract

A method is presented that allows direct measurement of a wide range of spring constants of cantilevers using an indentation instrument with an integrated optical microscope. An uncertainty of less than 10% can be achieved for spring constants from 0.1 to 10(2) Nm. The technique makes it possible to measure the spring constant at any desired location on a cantilever of any shape, particularly at the tip location of an atomic force microscopy cantilever. The article also demonstrates a technique to detect and correct apparent length anomalies of cantilevers by analyzing spring constants at multiple positions.

Mesh:

Year:  2007        PMID: 17614617     DOI: 10.1063/1.2747095

Source DB:  PubMed          Journal:  Rev Sci Instrum        ISSN: 0034-6748            Impact factor:   1.523


  5 in total

1.  A direct micropipette-based calibration method for atomic force microscope cantilevers.

Authors:  Baoyu Liu; Yan Yu; Da-Kang Yao; Jin-Yu Shao
Journal:  Rev Sci Instrum       Date:  2009-06       Impact factor: 1.523

2.  Atomic Force Microscope Cantilever Flexural Stiffness Calibration: Toward a Standard Traceable Method.

Authors:  Richard S Gates; Mark G Reitsma; John A Kramar; Jon R Pratt
Journal:  J Res Natl Inst Stand Technol       Date:  2011-08-01

3.  Accurate calibration and uncertainty estimation of the normal spring constant of various AFM cantilevers.

Authors:  Yunpeng Song; Sen Wu; Linyan Xu; Xing Fu
Journal:  Sensors (Basel)       Date:  2015-03-10       Impact factor: 3.576

4.  Contact-free experimental determination of the static flexural spring constant of cantilever sensors using a microfluidic force tool.

Authors:  John D Parkin; Georg Hähner
Journal:  Beilstein J Nanotechnol       Date:  2016-03-30       Impact factor: 3.649

5.  Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach.

Authors:  Edgar Cruz Valeriano; José Juan Gervacio Arciniega; Christian Iván Enriquez Flores; Susana Meraz Dávila; Joel Moreno Palmerin; Martín Adelaido Hernández Landaverde; Yuri Lizbeth Chipatecua Godoy; Aime Margarita Gutiérrez Peralta; Rafael Ramírez Bon; José Martín Yañez Limón
Journal:  Beilstein J Nanotechnol       Date:  2020-05-04       Impact factor: 3.649

  5 in total

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