Literature DB >> 17501285

Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter.

Stefan P Hau-Riege1, Henry N Chapman, Jacek Krzywinski, Ryszard Sobierajski, Sasa Bajt, Richard A London, Magnus Bergh, Carl Caleman, Robert Nietubyc, Libor Juha, Jaroslav Kuba, Eberhard Spiller, Sherry Baker, Richard Bionta, K Sokolowski Tinten, Nikola Stojanovic, Benjawan Kjornrattanawanich, Eric Gullikson, Elke Plönjes, Sven Toleikis, Thomas Tschentscher.   

Abstract

At the recently built FLASH x-ray free-electron laser, we studied the reflectivity of Si/C multilayers with fluxes up to 3 x 10(14) W/cm2. Even though the nanostructures were ultimately completely destroyed, we found that they maintained their integrity and reflectance characteristics during the 25-fs-long pulse, with no evidence for any structural changes over lengths greater than 3 A. This experiment demonstrates that with intense ultrafast pulses, structural damage does not occur during the pulse, giving credence to the concept of diffraction imaging of single macromolecules.

Entities:  

Year:  2007        PMID： 17501285     DOI： 10.1103/PhysRevLett.98.145502

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


  4 in total

1.  Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements.

Authors:  Anton Barty; Carl Caleman; Andrew Aquila; Nicusor Timneanu; Lukas Lomb; Thomas A White; Jakob Andreasson; David Arnlund; Saša Bajt; Thomas R M Barends; Miriam Barthelmess; Michael J Bogan; Christoph Bostedt; John D Bozek; Ryan Coffee; Nicola Coppola; Jan Davidsson; Daniel P Deponte; R Bruce Doak; Tomas Ekeberg; Veit Elser; Sascha W Epp; Benjamin Erk; Holger Fleckenstein; Lutz Foucar; Petra Fromme; Heinz Graafsma; Lars Gumprecht; Janos Hajdu; Christina Y Hampton; Robert Hartmann; Andreas Hartmann; Günter Hauser; Helmut Hirsemann; Peter Holl; Mark S Hunter; Linda Johansson; Stephan Kassemeyer; Nils Kimmel; Richard A Kirian; Mengning Liang; Filipe R N C Maia; Erik Malmerberg; Stefano Marchesini; Andrew V Martin; Karol Nass; Richard Neutze; Christian Reich; Daniel Rolles; Benedikt Rudek; Artem Rudenko; Howard Scott; Ilme Schlichting; Joachim Schulz; M Marvin Seibert; Robert L Shoeman; Raymond G Sierra; Heike Soltau; John C H Spence; Francesco Stellato; Stephan Stern; Lothar Strüder; Joachim Ullrich; X Wang; Georg Weidenspointner; Uwe Weierstall; Cornelia B Wunderer; Henry N Chapman
Journal:  Nat Photonics       Date:  2012       Impact factor: 38.771

2.  Radiation-induced melting in coherent X-ray diffractive imaging at the nanoscale.

Authors:  O Ponomarenko; A Y Nikulin; H O Moser; P Yang; O Sakata
Journal:  J Synchrotron Radiat       Date:  2011-05-26       Impact factor: 2.616

3.  Determining chemically and spatially resolved atomic profile of low contrast interface structure with high resolution.

Authors:  Maheswar Nayak; P C Pradhan; G S Lodha
Journal:  Sci Rep       Date:  2015-03-02       Impact factor: 4.379

4.  Time dependence of X-ray polarizability of a crystal induced by an intense femtosecond X-ray pulse.

Authors:  A Leonov; D Ksenzov; A Benediktovitch; I Feranchuk; U Pietsch
Journal:  IUCrJ       Date:  2014-10-23       Impact factor: 4.769
  4 in total

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