| Literature DB >> 17385933 |
Shinya Yoshimoto1, Yuya Murata, Keisuke Kubo, Kazuhiro Tomita, Kenji Motoyoshi, Takehiko Kimura, Hiroyuki Okino, Rei Hobara, Iwao Matsuda, Shin-Ichi Honda, Mitsuhiro Katayama, Shuji Hasegawa.
Abstract
We performed four-terminal conductivity measurements on a CoSi2 nanowire (NW) at room temperature by using PtIr-coated carbon nanotube (CNT) tips in a four-tip scanning tunneling microscope. The physical stability and high aspect ratio of the CNT tips made it possible to reduce the probe spacing down to ca. 30 nm. The probe-spacing dependence of resistance showed diffusive transport even at 30 nm and no current leakage to the Si substrate.Entities:
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Year: 2007 PMID： 17385933 DOI： 10.1021/nl0630182
Source DB: PubMed Journal: Nano Lett ISSN： 1530-6984 Impact factor: 11.189