Literature DB >> 17280324

Polarization switching dynamics governed by the thermodynamic nucleation process in ultrathin ferroelectric films.

J Y Jo1, D J Kim, Y S Kim, S-B Choe, T K Song, J-G Yoon, T W Noh.   

Abstract

In most ferroelectrics, the domain nucleation barrier (U*) is thermally insurmountable; this is called "Landauer's paradox." However, we showed that, in ultrathin films, the large depolarization fields could lower U* to a level comparable to thermal energy (k(B)T), resulting in power-law decay of polarization. We empirically found a universal relation between the power-law decay exponent and U*/k(B)T. This relation will provide a practical but fundamental limit for capacitor-type ferroelectric devices, analogous to the superparamagnetic limit for magnetic memory devices.

Year:  2006        PMID: 17280324     DOI: 10.1103/PhysRevLett.97.247602

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  5 in total

1.  Intrinsic single-domain switching in ferroelectric materials on a nearly ideal surface.

Authors:  S V Kalinin; B J Rodriguez; S Jesse; Y H Chu; T Zhao; R Ramesh; S Choudhury; L Q Chen; E A Eliseev; A N Morozovska
Journal:  Proc Natl Acad Sci U S A       Date:  2007-12-12       Impact factor: 11.205

2.  Universal ferroelectric switching dynamics of vinylidene fluoride-trifluoroethylene copolymer films.

Authors:  Wei Jin Hu; Deng-Ming Juo; Lu You; Junling Wang; Yi-Chun Chen; Ying-Hao Chu; Tom Wu
Journal:  Sci Rep       Date:  2014-04-24       Impact factor: 4.379

3.  Molecular dynamics study of ferroelectric domain nucleation and domain switching dynamics.

Authors:  Vishal Boddu; Florian Endres; Paul Steinmann
Journal:  Sci Rep       Date:  2017-04-11       Impact factor: 4.379

4.  The role of lattice dynamics in ferroelectric switching.

Authors:  Qiwu Shi; Eric Parsonnet; Xiaoxing Cheng; Natalya Fedorova; Ren-Ci Peng; Abel Fernandez; Alexander Qualls; Xiaoxi Huang; Xue Chang; Hongrui Zhang; David Pesquera; Sujit Das; Dmitri Nikonov; Ian Young; Long-Qing Chen; Lane W Martin; Yen-Lin Huang; Jorge Íñiguez; Ramamoorthy Ramesh
Journal:  Nat Commun       Date:  2022-03-02       Impact factor: 14.919

5.  Thickness scaling of ferroelectricity in BiFeO3 by tomographic atomic force microscopy.

Authors:  James J Steffes; Roger A Ristau; Ramamoorthy Ramesh; Bryan D Huey
Journal:  Proc Natl Acad Sci U S A       Date:  2019-01-25       Impact factor: 11.205

  5 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.