Literature DB >> 16516776

Clinical comparison of 6 aberrometers. Part 2: statistical comparison in a test group.

Jos J Rozema1, Dirk E M Van Dyck, Marie-José Tassignon.   

Abstract

PURPOSE: To compare and mutually validate the measurements of 6 aberrometers: the Visual Function Analyzer (Tracey), the OPD-Scan (ARK-10000, Nidek), the Zywave (Bausch & Lomb), the WASCA (Carl Zeiss Meditec), the MultiSpot Hartmann-Shack device, and the Allegretto Wave Analyzer.
SETTING: University Hospital Antwerp, Antwerp, Belgium.
METHODS: This prospective study was conducted on a group of 44 healthy eyes with refractions ranging from -5.25 diopters (D) to +5.25 D (cylinder 0 to -2 D). For each aberrometer and each eye, the averaged Zernike data were used to calculate various kinds of root-mean-square (RMS). These parameters, together with the refractive parameters, were then analyzed with a repeated-measures analysis of variance (ANOVA) test, complemented by paired t tests. A similar analysis was done for the comparison of the variances of these parameters.
RESULTS: The aberrometers gave comparable values for all studied parameters with the following exceptions: The OPD-Scan underestimated the polynomials describing 4- and 5-fold symmetries, and the Visual Function Analyzer slightly overestimated the astigmatism terms. The 3rd-order radial RMS value was different for each device, as well as the RMS in the central 2.0 mm zone. The WASCA presented the lowest variance.
CONCLUSION: These results suggest that in healthy eyes, all aberrometers produced globally similar results but they may vary in some details.

Entities:  

Mesh:

Year:  2006        PMID: 16516776     DOI: 10.1016/j.jcrs.2004.11.052

Source DB:  PubMed          Journal:  J Cataract Refract Surg        ISSN: 0886-3350            Impact factor:   3.351


  15 in total

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Authors:  Jan O Huelle; Toam Katz; Jan Draeger; Milena Pahlitzsch; Vasyl Druchkiv; Johannes Steinberg; Gisbert Richard; Stephan J Linke
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Authors:  Michael J Dobos; Michael D Twa; Mark A Bullimore
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10.  Analysis of four aberrometers for evaluating lower and higher order aberrations.

Authors:  Fabiano Cade; Andrea Cruzat; Eleftherios I Paschalis; Lilian Espírito Santo; Roberto Pineda
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