Literature DB >> 16266253

Error-related negativity in children: effect of an observer.

Eun Young Kim1, Nobuyoshi Iwaki, Hiroyuki Uno, Tsugumichi Fujita.   

Abstract

This research assessed the effect of an observer upon error-related negativity (ERN) in 20 children (ages 7-11): 9 worked alone and 11 worked under the observation of a friend of theirs (alone/audience groups). Erroneous motor responses were recorded to Go and No-Go visual stimuli (triangles in different orientations) at three brain sites (Fz, Cz, and Pz). Results for children were consistent with past adult studies in showing a significantly larger ERN only to erroneous responses in both the alone and the audience groups. Children in the audience group produced larger ERNs than those in the alone group. Furthermore, older children (ages 9-11) produced larger ERNs than younger children (ages 7-8) in both groups. These findings were discussed in the context of an action monitoring system that regulates responses, detects errors, and entrains affective responses associated with correct and incorrect responses.

Entities:  

Mesh:

Year:  2005        PMID: 16266253     DOI: 10.1207/s15326942dn2803_7

Source DB:  PubMed          Journal:  Dev Neuropsychol        ISSN: 1532-6942            Impact factor:   2.253


  26 in total

1.  Error-related event-related potentials in children with attention-deficit hyperactivity disorder, oppositional defiant disorder, reading disorder, and math disorder.

Authors:  Andrea Burgio-Murphy; Rafael Klorman; Sally E Shaywitz; Jack M Fletcher; Karen E Marchione; John Holahan; Karla K Stuebing; Joan E Thatcher; Bennett A Shaywitz
Journal:  Biol Psychol       Date:  2006-12-17       Impact factor: 3.251

2.  The error-related negativity (ERN) and psychopathology: toward an endophenotype.

Authors:  Doreen M Olvet; Greg Hajcak
Journal:  Clin Psychol Rev       Date:  2008-07-09

3.  Electrocortical and behavioral measures of response monitoring in young children during a Go/No-Go task.

Authors:  Dana C Torpey; Greg Hajcak; Jiyon Kim; Autumn Kujawa; Daniel N Klein
Journal:  Dev Psychobiol       Date:  2011-08-03       Impact factor: 3.038

4.  Single-session attention bias modification and error-related brain activity.

Authors:  Brady D Nelson; Felicia Jackson; Nader Amir; Greg Hajcak
Journal:  Cogn Affect Behav Neurosci       Date:  2015-12       Impact factor: 3.282

5.  The error-related negativity (ERN) moderates the association between interpersonal stress and anxiety symptoms six months later.

Authors:  Iulia Banica; Aislinn Sandre; Grant S Shields; George M Slavich; Anna Weinberg
Journal:  Int J Psychophysiol       Date:  2020-04-08       Impact factor: 2.997

6.  A brief, computerized intervention targeting error sensitivity reduces the error-related negativity.

Authors:  Alexandria Meyer; Brittany Gibby; Karl Wissemann; Julia Klawohn; Greg Hajcak; Norman B Schmidt
Journal:  Cogn Affect Behav Neurosci       Date:  2020-02       Impact factor: 3.282

7.  Error-related negativity (ERN) and sustained threat: Conceptual framework and empirical evaluation in an adolescent sample.

Authors:  Anna Weinberg; Alexandria Meyer; Emily Hale-Rude; Greg Perlman; Roman Kotov; Daniel N Klein; Greg Hajcak
Journal:  Psychophysiology       Date:  2016-03       Impact factor: 4.016

8.  Susceptibility to the audience effect explains performance gap between children with and without autism in a theory of mind task.

Authors:  Coralie Chevallier; Julia Parish-Morris; Natasha Tonge; Lori Le; Judith Miller; Robert T Schultz
Journal:  J Exp Psychol Gen       Date:  2014-01-06

9.  An examination of error-related brain activity and its modulation by error value in young children.

Authors:  Dana C Torpey; Greg Hajcak; Daniel N Klein
Journal:  Dev Neuropsychol       Date:  2009       Impact factor: 2.253

10.  Attention bias modification reduces neural correlates of response monitoring.

Authors:  Brady D Nelson; Felicia Jackson; Nader Amir; Greg Hajcak
Journal:  Biol Psychol       Date:  2017-09-01       Impact factor: 3.251

View more

北京卡尤迪生物科技股份有限公司 © 2022-2023.