Literature DB >> 15323662

Optical spectroscopy of single impurity centers in semiconductors.

S Francoeur1, J F Klem, A Mascarenhas.   

Abstract

Using optical spectroscopy with diffraction limited spatial resolution, the possibility of measuring the luminescence from single impurity centers in a semiconductor is demonstrated. Selectively studying individual centers that are formed by two neighboring nitrogen atoms in GaAs makes it possible to unveil their otherwise concealed polarization anisotropy, analyze their selection rules, identify their particular configuration, map their spatial distribution, and demonstrate the presence of a diversity of local environments. Circumventing the limitation imposed by ensemble averaging and the ability to discriminate the individual electronic responses from discrete emitters provides an unprecedented perspective on the nanoscience of impurities.

Entities:  

Year:  2004        PMID: 15323662     DOI: 10.1103/PhysRevLett.93.067403

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  3 in total

1.  Single dopants in semiconductors.

Authors:  Paul M Koenraad; Michael E Flatté
Journal:  Nat Mater       Date:  2011-02       Impact factor: 43.841

2.  Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering.

Authors:  Changkui Hu; Qiong Chen; Fengxiang Chen; T H Gfroerer; M W Wanlass; Yong Zhang
Journal:  Light Sci Appl       Date:  2018-06-20       Impact factor: 17.782

3.  Single-defect spectroscopy in the shortwave infrared.

Authors:  Xiaojian Wu; Mijin Kim; Haoran Qu; YuHuang Wang
Journal:  Nat Commun       Date:  2019-06-17       Impact factor: 14.919

  3 in total

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