| Literature DB >> 15282906 |
John B Nezlek1, Rebecca M Plesko.
Abstract
The present study examined affect- self-based explanatory models of relationships between daily events and daily well-being. Twice a week for up to 10 weeks, participants described the events that occurred each day and provided measures of their daily affect, self-esteem, and depressogenic thinking. Participants also provided trait-level measures of affect, depression, and self-esteem. Measures of daily well-being representing each model covaried jointly and independently with daily negative and positive events. Positive events buffered the effects of negative events on daily self-esteem and daily depressogenic thinking, whereas there was no buffering effect for daily affect. More depressed people were more reactive to positive events, and those higher in trait PA were less reactive to negative events. Buffering effects for self-esteem were pronounced for those with lower trait self-esteem, and buffering effects for daily depressogenic adjustment were now more pronounced for those with higher trait negative affect. The results suggest that affect- and self-based models provide complementary perspectives on relationships between psychological well-being and daily events.Entities:
Mesh:
Year: 2003 PMID: 15282906 DOI: 10.1177/0146167203029005004
Source DB: PubMed Journal: Pers Soc Psychol Bull ISSN: 0146-1672