Literature DB >> 14611410

Role of oxygen at screw dislocations in GaN.

I Arslan1, N D Browning.   

Abstract

Here we report the first direct atomic scale experimental observations of oxygen segregation to screw dislocations in GaN using correlated techniques in the scanning transmission electron microscope. The amount of oxygen present in each of the three distinct types of screw dislocation core is found to depend on the evolution and structure of the core, and thus gives rise to a varying concentration of localized states in the band gap. Contrary to previous theoretical predictions, the substitution of oxygen for nitrogen is observed to extend over many monolayers for the open core dislocation.

Entities:  

Year:  2003        PMID: 14611410     DOI: 10.1103/PhysRevLett.91.165501

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  2 in total

1.  Utilization of native oxygen in Eu(RE)-doped GaN for enabling device compatibility in optoelectronic applications.

Authors:  B Mitchell; D Timmerman; J Poplawsky; W Zhu; D Lee; R Wakamatsu; J Takatsu; M Matsuda; W Guo; K Lorenz; E Alves; A Koizumi; V Dierolf; Y Fujiwara
Journal:  Sci Rep       Date:  2016-01-04       Impact factor: 4.379

2.  Measurement of Diffusion and Segregation in Semiconductor Quantum Dots and Quantum Wells by Transmission Electron Microscopy: A Guide.

Authors:  Thomas Walther
Journal:  Nanomaterials (Basel)       Date:  2019-06-08       Impact factor: 5.076

  2 in total

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