Literature DB >> 12503669

Anencephaly with placental attachment.

C K Sasidharan1, P Anoop.   

Abstract

Anencephaly is a severe defect of development of the neuraxis that is incompatible with survival. This particular neural tube defect is characterised by the absence of large portions of the cranium. The peculiar feature in this baby is the abnormal attachment of the placenta to the site of the skull defect.

Entities:  

Mesh:

Year:  2002        PMID: 12503669     DOI: 10.1007/bf02726023

Source DB:  PubMed          Journal:  Indian J Pediatr        ISSN: 0019-5456            Impact factor:   1.967


  7 in total

Review 1.  The infant with anencephaly.

Authors: 
Journal:  N Engl J Med       Date:  1990-03-08       Impact factor: 91.245

2.  Screening for neural tube defects in the United States. A summary of the Scarborough Conference.

Authors:  J N Macri; J E Haddow; R R Weiss
Journal:  Am J Obstet Gynecol       Date:  1979-01-15       Impact factor: 8.661

3.  Antenatal diagnosis of neural tube defects.

Authors:  B Field; G Mitchell; C Kerr
Journal:  Med J Aust       Date:  1976-07-03       Impact factor: 7.738

4.  Prenatal diagnosis of neural tube defects.

Authors:  J N Macri; R R Weiss; R Tillitt; D Balsam; K W Elligers
Journal:  JAMA       Date:  1976-09-13       Impact factor: 56.272

5.  Avoidance of anencephalic and spina bifida births by maternal serum-alphafetoprotein screening.

Authors:  M A Ferguson-Smith; H A Rawlinson; H M May; H A Tait; J D Vince; A A Gibson; H P Robinson; J G Ratcliffe
Journal:  Lancet       Date:  1978-06-24       Impact factor: 79.321

6.  Maternal drug histories and central nervous system anomalies.

Authors:  K A Winship; D A Cahal; J C Weber; J P Griffin
Journal:  Arch Dis Child       Date:  1984-11       Impact factor: 3.791

7.  Prenatal diagnosis of neural tube defects. III. A reevaluation of the alpha-fetoprotein assay.

Authors:  M E Kimball; A Milunsky; E Alpert
Journal:  Obstet Gynecol       Date:  1977-05       Impact factor: 7.661

  7 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.