Literature DB >> 12380818

Organic secondary ion mass spectrometry: sensitivity enhancement by gold deposition.

A Delcorte1, N Médard, P Bertrand.   

Abstract

Hydrocarbon oligomers, high-molecular-weight polymers, and polymer additives have been covered with 2-60 nmol of gold/cm2 in order to enhance the ionization efficiency for static secondary ion mass spectrometry (s-SIMS) measurements. Au-cationized molecules (up to -3,000 Da) and fragments (up to the trimer) are observed in the positive mass spectra of metallized polystyrene (PS) oligomer films. Beyond 3,000 Da, the entanglement of polymer chains prevents the ejection of intact molecules from a "thick" organic film. This mass limit can be overcome by embedding the polymer chains in a low-molecular-weight matix. The diffusion of organic molecules over the metal surfaces is also demonstrated for short PS oligomers. In the case of high-molecular-weight polymers (polyethylene, polypropylene, PS) and polymer additives (Irganox 1010, Irgafos 168), the metallization procedure induces a dramatic increase of the fingerprint fragment ion yields as well as the formation of new Aucationized species that can be used for chemical diagnostics. In comparison with the deposition of submonolayers of organic molecules on metallic surfaces, metal evaporation onto organic samples provides a comparable sensitivity enhancement. The distinct advantage of the metal evaporation procedure is that it can be used for any kind of organic sample, irrespective of thickness, opening new perspectives for "real world" sample analysis and chemical imaging by s-SIMS.

Entities:  

Year:  2002        PMID: 12380818     DOI: 10.1021/ac020125h

Source DB:  PubMed          Journal:  Anal Chem        ISSN: 0003-2700            Impact factor:   6.986


  9 in total

1.  Enhanced MALDI ionization efficiency at the metal-matrix interface: practical and mechanistic consequences of sample thickness and preparation method.

Authors:  Gregor McCombie; Richard Knochenmuss
Journal:  J Am Soc Mass Spectrom       Date:  2006-03-20       Impact factor: 3.109

2.  Polyelectrolytes as new matrices for secondary ion mass spectrometry.

Authors:  Yit-Yian Lua; Li Yang; Craig A Pew; Feng Zhang; W Jonathan J Fillmore; R Todd Bronson; Amarchand Sathyapalan; Paul B Savage; Jed D Whittaker; Robert C Davis; Matthew R Linford
Journal:  J Am Soc Mass Spectrom       Date:  2005-10       Impact factor: 3.109

3.  Organic secondary ion mass spectrometry: signal enhancement by water vapor injection.

Authors:  Taoufiq Mouhib; Arnaud Delcorte; Claude Poleunis; Patrick Bertrand
Journal:  J Am Soc Mass Spectrom       Date:  2010-08-27       Impact factor: 3.109

4.  Secondary ion mass spectrometry imaging of molecular distributions in cultured neurons and their processes: comparative analysis of sample preparation.

Authors:  Kevin R Tucker; Zhen Li; Stanislav S Rubakhin; Jonathan V Sweedler
Journal:  J Am Soc Mass Spectrom       Date:  2012-08-29       Impact factor: 3.109

5.  In situ temperature-time effect on MetA-S-SIMS.

Authors:  Roel De Mondt; Luc Van Vaeck; Jens Lenaerts
Journal:  J Am Soc Mass Spectrom       Date:  2006-11-13       Impact factor: 3.109

6.  Influence of the organic layer thickness in (metal-assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles.

Authors:  Nimer Wehbe; Taoufiq Mouhib; Aneesh Prabhakaran; Patrick Bertrand; Arnaud Delcorte
Journal:  J Am Soc Mass Spectrom       Date:  2009-09-03       Impact factor: 3.109

7.  Metal-assisted polyatomic SIMS and laser desorption/ionization for enhanced small molecule imaging of bacterial biofilms.

Authors:  Sage J B Dunham; Troy J Comi; Kyungwon Ko; Bin Li; Nameera F Baig; Nydia Morales-Soto; Joshua D Shrout; Paul W Bohn; Jonathan V Sweedler
Journal:  Biointerphases       Date:  2016-06-04       Impact factor: 2.456

8.  Suppression and enhancement of secondary ion formation due to the chemical environment in static-secondary ion mass spectrometry.

Authors:  Emrys A Jones; Nicholas P Lockyer; Jeanette Kordys; John C Vickerman
Journal:  J Am Soc Mass Spectrom       Date:  2007-05-24       Impact factor: 3.109

Review 9.  Surface Characterization of Polymer Blends by XPS and ToF-SIMS.

Authors:  Chi Ming Chan; Lu-Tao Weng
Journal:  Materials (Basel)       Date:  2016-08-04       Impact factor: 3.623

  9 in total

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