| Literature DB >> 121759 |
Abstract
Electron micrographs of cytological damage to log phase Pseudomonas aeruginosa caused by low consentrations of chlorhexidine indicate an action primarily on the cytoplasmic membrane at concentration of 2.0--3.0 micrograms/ml chlorhexidine, and on the cytoplasmic membrane plus layers external to it at concentrations greater than 3.0 micrograms/ml. Evidence of two types of resistance to chlorhexidine is presented.Entities:
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Year: 1979 PMID: 121759
Source DB: PubMed Journal: Microbios ISSN: 0026-2633