| Literature DB >> 11972371 |
Yoshio Suzuki1, Naoto Yagi, Kentaro Uesugi.
Abstract
Refraction-enhanced imaging is now widely used for imaging low-absorption-contrast specimens in the hard X-ray region. However, the interpretation of the details of a refraction-enhanced image is not always clear. In this paper the theoretical treatment of refraction-enhanced imaging and a method for phase retrieval from refraction-contrast images are discussed in comparison with angular-deflection mapping of the transmitting beam. The problems of thick and complicated objects are also discussed.Mesh:
Year: 2002 PMID: 11972371 DOI: 10.1107/s090904950200554x
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616