| Literature DB >> 10673314 |
B J Garrison1, A Delcorte, K D Krantzman.
Abstract
Molecular dynamics simulations have been used to model the kiloelectronvolt particle bombardment of organic layers on metal substrates such as occurs in the analytical techniques of secondary ion mass spectrometry and fast atom bombardment mass spectrometry. Vignettes of insights gained from the simulations along with comparisons to experimental data are presented in this Account. Topics include intact molecular ejection vs fragmentation, prediction of reaction pathways, influence of the substrate, and quantitative predictions of energy and angular distributions.Entities:
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Year: 2000 PMID: 10673314 DOI: 10.1021/ar970135i
Source DB: PubMed Journal: Acc Chem Res ISSN: 0001-4842 Impact factor: 22.384