Composition of fluoridated dental enamel studied by x-ray photoelectron spectroscopy (ESCA).

A combination of ESCA and argon-ion etching has been shown to be effective in determining the surface and subsurface composition of dental enamel. The heavy organic coating on enamel has been investigated. Beneath this coating, untreated enamel was found to have invariant phosphorus and calcuim concentrations over the region surface. The surface of enamel treated with an acid phosphate-fluoride gel was shown to be almost entirely connected to calcium fluoride. A phosphate species, noncalcium and possibly a sodium salt, was found to be present in the surface layer. At a depth lower than about 60 nm, there was a gradual increase in phosphorus concentration that approached the value for untreated enamel with increasing depth. The increasing phosphorus and decreasing fluorine concentrations were primarily caused by the increasing concentration of unreacted hydroxyapatite. These results have shown that ESCA coupled with argon-ion etching, can be used effectively to examine the surface and subsurface composition of dental enamel. The surface sensitivity, ability to strip thin layers of material, sensitivity to low atomic weight elements, and ability to differentiate between different oxidation states makes a combination of these two techniques extremely useful for dental research.