Literature DB >> 10037898

Secondary ion emission induced by multicharged 18-keV ion bombardment of solid targets.

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Abstract

Year:  1988        PMID： 10037898     DOI： 10.1103/PhysRevLett.60.948

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


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  2 in total

1.  Time-of-flight secondary ion mass spectrometry of matrix-diluted oligo- and polypeptides bombarded with slow and fast projectiles: positive and negative matrix and analyte ion yields, background signals, and sample aging.

Authors:  K Wittmaack; W Szymczak; G Hoheisel; W Tuszynski
Journal:  J Am Soc Mass Spectrom       Date:  2000-06       Impact factor: 3.109

2.  An investigation of secondary ion yield enhancement using Bin2+ (n=1,3,5) primary ions.

Authors:  Gabriella Nagy; Peng Lu; Amy V Walker
Journal:  J Am Soc Mass Spectrom       Date:  2008-01       Impact factor: 3.109
  2 in total

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