Literature DB >> 9998899

Detection of energy-selected secondary electrons in coincidence with energy-loss events in thin carbon foils.

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Abstract

Entities:  

Year:  1991        PMID： 9998899     DOI： 10.1103/physrevb.44.9192

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


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  4 in total

1.  Imaging single atoms using secondary electrons with an aberration-corrected electron microscope.

Authors:  Y Zhu; H Inada; K Nakamura; J Wall
Journal:  Nat Mater       Date:  2009-09-20       Impact factor: 43.841

Review 2.  Surface excitations in the modelling of electron transport for electron-beam-induced deposition experiments.

Authors:  Francesc Salvat-Pujol; Roser Valentí; Wolfgang S Werner
Journal:  Beilstein J Nanotechnol       Date:  2015-06-03       Impact factor: 3.649

3.  Sub-nanometre resolution imaging of polymer-fullerene photovoltaic blends using energy-filtered scanning electron microscopy.

Authors:  Robert C Masters; Andrew J Pearson; Tom S Glen; Fabian-Cyril Sasam; Letian Li; Maurizio Dapor; Athene M Donald; David G Lidzey; Cornelia Rodenburg
Journal:  Nat Commun       Date:  2015-04-24       Impact factor: 14.919

4.  Outrunning damage: Electrons vs X-rays-timescales and mechanisms.

Authors:  John C H Spence
Journal:  Struct Dyn       Date:  2017-06-01       Impact factor: 2.920
  4 in total

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