Literature DB >> 9998106

Microscopic theory of second-order Raman scattering in silicon under uniaxial stress.

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Abstract

Year:  1991        PMID: 9998106     DOI: 10.1103/physrevb.43.6633

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN: 0163-1829


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  1 in total

1.  Ab Initio Approach to Second-order Resonant Raman Scattering Including Exciton-Phonon Interaction.

Authors:  Yannick Gillet; Stefan Kontur; Matteo Giantomassi; Claudia Draxl; Xavier Gonze
Journal:  Sci Rep       Date:  2017-08-04       Impact factor: 4.379

  1 in total

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