Literature DB >> 9997784

Electrical properties of silicon point contacts.

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Abstract

Entities:  

Year:  1991        PMID： 9997784     DOI： 10.1103/physrevb.43.4317

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


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  2 in total

1.  Conductive-probe atomic force microscopy characterization of silicon nanowire.

Authors:  José Alvarez; Irène Ngo; Marie-Estelle Gueunier-Farret; Jean-Paul Kleider; Linwei Yu; Pere Rocai Cabarrocas; Simon Perraud; Emmanuelle Rouvière; Caroline Celle; Céline Mouchet; Jean-Pierre Simonato
Journal:  Nanoscale Res Lett       Date:  2011-01-31       Impact factor: 4.703

2.  Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination.

Authors:  Paul Narchi; Jose Alvarez; Pascal Chrétien; Gennaro Picardi; Romain Cariou; Martin Foldyna; Patricia Prod'homme; Jean-Paul Kleider; Pere Roca I Cabarrocas
Journal:  Nanoscale Res Lett       Date:  2016-02-01       Impact factor: 4.703
  2 in total

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