Literature DB >> 9997755

Defect relaxation in amorphous silicon: Stretched exponentials, the Meyer-Neldel rule, and the Staebler-Wronski effect.

.   

Abstract

Entities:  

Year:  1991        PMID： 9997755     DOI： 10.1103/physrevb.43.4057

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


× No keyword cloud information.
  1 in total

1.  Phenomenological Model for Defect Interactions in Irradiated Functional Materials.

Authors:  Steven J Brewer; Cory D Cress; Samuel C Williams; Hanhan Zhou; Manuel Rivas; Ryan Q Rudy; Ronald G Polcawich; Evan R Glaser; Jacob L Jones; Nazanin Bassiri-Gharb
Journal:  Sci Rep       Date:  2017-07-13       Impact factor: 4.379
  1 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.