Literature DB >> 9993382

Positron trapping in semiconductors.

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Abstract

Year:  1990        PMID： 9993382     DOI： 10.1103/physrevb.41.9980

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


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  2 in total

1.  Decoupling free-carriers contributions from oxygen-vacancy and cation-substitution in extrinsic conducting oxides.

Authors:  Y H Lin; Y S Liu; Y C Lin; Y S Wei; K S Liao; K R Lee; J Y Lai; H M Chen; Y C Jean; C Y Liu
Journal:  J Appl Phys       Date:  2013-01-18       Impact factor: 2.546

2.  Positron annihilation spectroscopy of vacancy-related defects in CdTe:Cl and CdZnTe:Ge at different stoichiometry deviations.

Authors:  L Šedivý; J Čížek; E Belas; R Grill; O Melikhova
Journal:  Sci Rep       Date:  2016-02-10       Impact factor: 4.379
  2 in total

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