Literature DB >> 9986589

Local transport properties of thin bismuth films studied by scanning tunneling potentiometry.

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Abstract

Entities:  

Year:  1996        PMID： 9986589     DOI： 10.1103/physrevb.54.r5283

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


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  1 in total

1.  Electrical resistance of individual defects at a topological insulator surface.

Authors:  Felix Lüpke; Markus Eschbach; Tristan Heider; Martin Lanius; Peter Schüffelgen; Daniel Rosenbach; Nils von den Driesch; Vasily Cherepanov; Gregor Mussler; Lukasz Plucinski; Detlev Grützmacher; Claus M Schneider; Bert Voigtländer
Journal:  Nat Commun       Date:  2017-06-12       Impact factor: 14.919
  1 in total

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