Literature DB >> 9986432

Defect identification using the core-electron contribution in Doppler-broadening spectroscopy of positron-annihilation radiation.

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Abstract

Year:  1996        PMID: 9986432     DOI: 10.1103/physrevb.54.4722

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN: 0163-1829


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1.  Defect Characterization in SiGe/SOI Epitaxial Semiconductors by Positron Annihilation.

Authors:  R Ferragut; A Calloni; A Dupasquier; G Isella
Journal:  Nanoscale Res Lett       Date:  2010-10-24       Impact factor: 4.703

  1 in total

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