Literature DB >> 9983102

Segregation and diffusion on semiconductor surfaces.

.   

Abstract

Year:  1996        PMID： 9983102     DOI： 10.1103/physrevb.53.13551

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


× No keyword cloud information.
  1 in total

1.  Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation.

Authors:  Anirudhan Chandrasekaran; Robbert W E van de Kruijs; Jacobus M Sturm; Andrey A Zameshin; Fred Bijkerk
Journal:  ACS Appl Mater Interfaces       Date:  2019-12-02       Impact factor: 9.229
  1 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.