Literature DB >> 9982734

Stretched-exponential relaxation modeled without invoking statistical distributions.

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Abstract

Year:  1996        PMID: 9982734     DOI: 10.1103/physrevb.53.11292

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN: 0163-1829


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  2 in total

1.  Purcell Enhancement of Erbium Ions in TiO2 on Silicon Nanocavities.

Authors:  Alan M Dibos; Michael T Solomon; Sean E Sullivan; Manish K Singh; Kathryn E Sautter; Connor P Horn; Gregory D Grant; Yulin Lin; Jianguo Wen; F Joseph Heremans; Supratik Guha; David D Awschalom
Journal:  Nano Lett       Date:  2022-08-08       Impact factor: 12.262

2.  Electrometry by optical charge conversion of deep defects in 4H-SiC.

Authors:  G Wolfowicz; S J Whiteley; D D Awschalom
Journal:  Proc Natl Acad Sci U S A       Date:  2018-07-16       Impact factor: 11.205

  2 in total

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