Literature DB >> 9981697

Real-time spectroscopic ellipsometry study of the growth of amorphous and microcrystalline silicon thin films prepared by alternating silicon deposition and hydrogen plasma treatment.

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Abstract

Entities:  

Year:  1995        PMID： 9981697     DOI： 10.1103/physrevb.52.5136

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


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  1 in total

Review 1.  Nanocrystalline silicon thin film growth and application for silicon heterojunction solar cells: a short review.

Authors:  Mansi Sharma; Jagannath Panigrahi; Vamsi K Komarala
Journal:  Nanoscale Adv       Date:  2021-05-17
  1 in total

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