Literature DB >> 9980511

Test of the Peierls-Nabarro model for dislocations in silicon.

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Abstract

Entities:  

Year:  1995        PMID： 9980511     DOI： 10.1103/physrevb.52.13223

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


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  1 in total

1.  Full-Field Strain Mapping at a Ge/Si Heterostructure Interface.

Authors:  Jijun Li; Chunwang Zhao; Yongming Xing; Shaojian Su; Buwen Cheng
Journal:  Materials (Basel)       Date:  2013-05-24       Impact factor: 3.623
  1 in total

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