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Literature DB >> 9978983

X-ray diffraction from Si/Ge layers: Diffuse scattering in the region of total external reflection.

Abstract

Source DB: PubMed Journal: Phys Rev B Condens Matter ISSN： 0163-1829

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2 in total

Authors: A M Edwards; J K Blasie; J C Bean
Journal: Biophys J Date: 1998-03 Impact factor: 4.033

Authors: Surendra Singh; J W Freeland; M R Fitzsimmons; H Jeen; A Biswas
Journal: Sci Rep Date: 2016-07-27 Impact factor: 4.379

2 in total