Literature DB >> 9976268

Electronic structure of buried alpha -FeSi2 and beta -FeSi2 layers: Soft-x-ray-emission and -absorption studies compared to band-structure calculations.

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Abstract

Year:  1994        PMID: 9976268     DOI: 10.1103/physrevb.50.18330

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN: 0163-1829


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  1 in total

1.  Itinerant magnetism in doped semiconducting β-FeSi₂ and CrSi₂.

Authors:  David J Singh; David Parker
Journal:  Sci Rep       Date:  2013-12-17       Impact factor: 4.379

  1 in total

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