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Literature DB >> 9962162

Dynamic fuse model for electromigration failure of polycrystalline metal films.

Abstract

Source DB: PubMed Journal: Phys Rev E Stat Phys Plasmas Fluids Relat Interdiscip Topics ISSN： 1063-651X

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Authors: Didier Sornette
Journal: Proc Natl Acad Sci U S A Date: 2002-02-19 Impact factor: 11.205

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