Literature DB >> 9947553

Structural determination of crystalline silicon by extended energy-loss fine-structure spectroscopy.

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Abstract

Entities:  

Year:  1989        PMID: 9947553     DOI: 10.1103/physrevb.39.8409

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN: 0163-1829


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  2 in total

Review 1.  Hierarchical adaptive nanostructured PVD coatings for extreme tribological applications: the quest for nonequilibrium states and emergent behavior.

Authors:  German S Fox-Rabinovich; Kenji Yamamoto; Ben D Beake; Iosif S Gershman; Anatoly I Kovalev; Stephen C Veldhuis; Myriam H Aguirre; Goulnara Dosbaeva; Jose L Endrino
Journal:  Sci Technol Adv Mater       Date:  2012-07-31       Impact factor: 8.090

2.  Understanding of sub-band gap absorption of femtosecond-laser sulfur hyperdoped silicon using synchrotron-based techniques.

Authors:  Mukta V Limaye; S C Chen; C Y Lee; L Y Chen; Shashi B Singh; Y C Shao; Y F Wang; S H Hsieh; H C Hsueh; J W Chiou; C H Chen; L Y Jang; C L Cheng; W F Pong; Y F Hu
Journal:  Sci Rep       Date:  2015-06-22       Impact factor: 4.379

  2 in total

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