Literature DB >> 9946719

Connection between the Meyer-Neldel relation and multiple-trapping transport.

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Abstract

Year:  1988        PMID: 9946719     DOI: 10.1103/physrevb.38.3595

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN: 0163-1829


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  1 in total

1.  Analysis of the Conduction Mechanism and Copper Vacancy Density in p-type Cu2O Thin Films.

Authors:  Sanggil Han; Andrew J Flewitt
Journal:  Sci Rep       Date:  2017-07-18       Impact factor: 4.379

  1 in total

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