Literature DB >> 9946381

Determination of the inversion-layer thickness from capacitance measurements of metal-oxide-semiconductor field-effect transistors with ultrathin oxide layers.

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Abstract

Entities:  

Year:  1988        PMID： 9946381     DOI： 10.1103/physrevb.38.1235

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


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  1 in total

1.  Random telegraph noise from resonant tunnelling at low temperatures.

Authors:  Zuo Li; Moïse Sotto; Fayong Liu; Muhammad Khaled Husain; Hiroyuki Yoshimoto; Yoshitaka Sasago; Digh Hisamoto; Isao Tomita; Yoshishige Tsuchiya; Shinichi Saito
Journal:  Sci Rep       Date:  2018-01-10       Impact factor: 4.379
  1 in total

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