Literature DB >> 9937772

Raman scattering in ultraheavily doped silicon.

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Abstract

Entities:  

Year:  1985        PMID： 9937772     DOI： 10.1103/physrevb.32.5464

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


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  1 in total

1.  Structural and optical characterization of pure Si-rich nitride thin films.

Authors:  Olivier Debieu; Ramesh Pratibha Nalini; Julien Cardin; Xavier Portier; Jacques Perrière; Fabrice Gourbilleau
Journal:  Nanoscale Res Lett       Date:  2013-01-16       Impact factor: 4.703
  1 in total

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