Literature DB >> 9937094

Structural information from the Raman spectrum of amorphous silicon.

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Abstract

Entities:  

Year:  1985        PMID： 9937094     DOI： 10.1103/physrevb.32.874

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


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  8 in total

1.  In situ spectroscopic study of the plastic deformation of amorphous silicon under non-hydrostatic conditions induced by indentation.

Authors:  Y B Gerbig; C A Michaels; J E Bradby; B Haberl; R F Cook
Journal:  Phys Rev B Condens Matter Mater Phys       Date:  2015-12-17

2.  Morphological and nanostructural features of porous silicon prepared by electrochemical etching.

Authors:  Hyohan Kim; Namhee Cho
Journal:  Nanoscale Res Lett       Date:  2012-07-20       Impact factor: 4.703

3.  Photon pair generation in hydrogenated amorphous silicon microring resonators.

Authors:  Elizabeth Hemsley; Damien Bonneau; Jason Pelc; Ray Beausoleil; Jeremy L O'Brien; Mark G Thompson
Journal:  Sci Rep       Date:  2016-12-20       Impact factor: 4.379

4.  Crystallographic Characterisation of Ultra-Thin, or Amorphous Transparent Conducting Oxides-The Case for Raman Spectroscopy.

Authors:  David Caffrey; Ainur Zhussupbekova; Rajani K Vijayaraghavan; Ardak Ainabayev; Aitkazy Kaisha; Gulnar Sugurbekova; Igor V Shvets; Karsten Fleischer
Journal:  Materials (Basel)       Date:  2020-01-07       Impact factor: 3.623

5.  Distilling nanoscale heterogeneity of amorphous silicon using tip-enhanced Raman spectroscopy (TERS) via multiresolution manifold learning.

Authors:  Guang Yang; Xin Li; Yongqiang Cheng; Mingchao Wang; Dong Ma; Alexei P Sokolov; Sergei V Kalinin; Gabriel M Veith; Jagjit Nanda
Journal:  Nat Commun       Date:  2021-01-25       Impact factor: 14.919

6.  Si-rich Al2O3 films grown by RF magnetron sputtering: structural and photoluminescence properties versus annealing treatment.

Authors:  Nadiia Korsunska; Larysa Khomenkova; Oleksandr Kolomys; Viktor Strelchuk; Andrian Kuchuk; Vasyl Kladko; Tetyana Stara; Oleksandr Oberemok; Borys Romanyuk; Philippe Marie; Jedrzej Jedrzejewski; Isaac Balberg
Journal:  Nanoscale Res Lett       Date:  2013-06-07       Impact factor: 4.703

7.  Inversion of diffraction data for amorphous materials.

Authors:  Anup Pandey; Parthapratim Biswas; D A Drabold
Journal:  Sci Rep       Date:  2016-09-22       Impact factor: 4.379

8.  Nanoscale structural defects in oblique Ar+ sputtered Si(111) surfaces.

Authors:  Divya Gupta; Mahak Chawla; Rahul Singhal; Sanjeev Aggarwal
Journal:  Sci Rep       Date:  2019-10-29       Impact factor: 4.379
  8 in total

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