Literature DB >> 9936996

Surface roughness at the Si(100)-SiO2 interface.

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Abstract

Entities:  

Year:  1985        PMID: 9936996     DOI: 10.1103/physrevb.32.8171

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN: 0163-1829


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  3 in total

1.  Electrically driven spin qubit based on valley mixing.

Authors:  Wister Huang; Menno Veldhorst; Neil M Zimmerman; Andrew S Dzurak; Dimitrie Culcer
Journal:  Phys Rev B       Date:  2017-02-02       Impact factor: 4.036

2.  Tailoring of Seebeck coefficient with surface roughness effects in silicon sub-50-nm films.

Authors:  Manoj Kumar; Anjana Bagga; S Neeleshwar
Journal:  Nanoscale Res Lett       Date:  2012-03-05       Impact factor: 4.703

3.  Multi-scale electronics transport properties in non-ideal CVD graphene sheet.

Authors:  Bhupesh Bishnoi; Marius Buerkle; Hisao Nakamura
Journal:  Sci Rep       Date:  2022-07-02       Impact factor: 4.996

  3 in total

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