Effects of cetyltrimethylammonium bromide (CTAB) surfactant upon the dielectric properties of yeast cells.

The dielectric properties of yeast cells in the absence and presence of cetyltrimethylammonium bromide (CTAB) were investigated. The surfactant concentration range was between 0.0 and 1.0 mM. The experimental permittivity and conductivity spectra of frequency were analyzed by means of the two-shell electrical cell model (Irimajiri et al., Bull. Inst. Chem. Res., Kyoto Univ. 69 (1991) 421-438), and the electrical phase parameters of cells were subsequently evaluated. The cytoplasm conductivity and the conductivity of the vacuole interior decreased drastically by treating the cells with surfactant. The apparent capacitance of the plasma membrane increased systematically from 0.65 microF/cm2, for untreated cells, up to about 0.75 microF/cm2, at 0.3 mM CTAB. This growth was ascribed to the increase in the folding of the membrane surface associated with the surfactant-induced cell shrinkage. A further addition of the surfactant entailed a gradual decrease of the capacitance that was assigned to the membrane solubilization by the surfactant molecules. Within the accuracy of the data, the specific capacitance of the vacuole membrane was nearly constant (0.544+/-0.021 microF/cm2) over the whole surfactant concentration range. Also, the cytoplasm permittivity remained constant at 64.3+/-4.5.